|  | /* SPDX-License-Identifier: GPL-2.0-or-later */ | 
|  | /* | 
|  | *  NAND family Bad Block Management (BBM) header file | 
|  | *    - Bad Block Table (BBT) implementation | 
|  | * | 
|  | *  Copyright © 2005 Samsung Electronics | 
|  | *  Kyungmin Park <[email protected]> | 
|  | * | 
|  | *  Copyright © 2000-2005 | 
|  | *  Thomas Gleixner <[email protected]> | 
|  | */ | 
|  | #ifndef __LINUX_MTD_BBM_H | 
|  | #define __LINUX_MTD_BBM_H | 
|  |  | 
|  | /* The maximum number of NAND chips in an array */ | 
|  | #define NAND_MAX_CHIPS		8 | 
|  |  | 
|  | /** | 
|  | * struct nand_bbt_descr - bad block table descriptor | 
|  | * @options:	options for this descriptor | 
|  | * @pages:	the page(s) where we find the bbt, used with option BBT_ABSPAGE | 
|  | *		when bbt is searched, then we store the found bbts pages here. | 
|  | *		Its an array and supports up to 8 chips now | 
|  | * @offs:	offset of the pattern in the oob area of the page | 
|  | * @veroffs:	offset of the bbt version counter in the oob are of the page | 
|  | * @version:	version read from the bbt page during scan | 
|  | * @len:	length of the pattern, if 0 no pattern check is performed | 
|  | * @maxblocks:	maximum number of blocks to search for a bbt. This number of | 
|  | *		blocks is reserved at the end of the device where the tables are | 
|  | *		written. | 
|  | * @reserved_block_code: if non-0, this pattern denotes a reserved (rather than | 
|  | *              bad) block in the stored bbt | 
|  | * @pattern:	pattern to identify bad block table or factory marked good / | 
|  | *		bad blocks, can be NULL, if len = 0 | 
|  | * | 
|  | * Descriptor for the bad block table marker and the descriptor for the | 
|  | * pattern which identifies good and bad blocks. The assumption is made | 
|  | * that the pattern and the version count are always located in the oob area | 
|  | * of the first block. | 
|  | */ | 
|  | struct nand_bbt_descr { | 
|  | int options; | 
|  | int pages[NAND_MAX_CHIPS]; | 
|  | int offs; | 
|  | int veroffs; | 
|  | uint8_t version[NAND_MAX_CHIPS]; | 
|  | int len; | 
|  | int maxblocks; | 
|  | int reserved_block_code; | 
|  | uint8_t *pattern; | 
|  | }; | 
|  |  | 
|  | /* Options for the bad block table descriptors */ | 
|  |  | 
|  | /* The number of bits used per block in the bbt on the device */ | 
|  | #define NAND_BBT_NRBITS_MSK	0x0000000F | 
|  | #define NAND_BBT_1BIT		0x00000001 | 
|  | #define NAND_BBT_2BIT		0x00000002 | 
|  | #define NAND_BBT_4BIT		0x00000004 | 
|  | #define NAND_BBT_8BIT		0x00000008 | 
|  | /* The bad block table is in the last good block of the device */ | 
|  | #define NAND_BBT_LASTBLOCK	0x00000010 | 
|  | /* The bbt is at the given page, else we must scan for the bbt */ | 
|  | #define NAND_BBT_ABSPAGE	0x00000020 | 
|  | /* bbt is stored per chip on multichip devices */ | 
|  | #define NAND_BBT_PERCHIP	0x00000080 | 
|  | /* bbt has a version counter at offset veroffs */ | 
|  | #define NAND_BBT_VERSION	0x00000100 | 
|  | /* Create a bbt if none exists */ | 
|  | #define NAND_BBT_CREATE		0x00000200 | 
|  | /* | 
|  | * Create an empty BBT with no vendor information. Vendor's information may be | 
|  | * unavailable, for example, if the NAND controller has a different data and OOB | 
|  | * layout or if this information is already purged. Must be used in conjunction | 
|  | * with NAND_BBT_CREATE. | 
|  | */ | 
|  | #define NAND_BBT_CREATE_EMPTY	0x00000400 | 
|  | /* Write bbt if neccecary */ | 
|  | #define NAND_BBT_WRITE		0x00002000 | 
|  | /* Read and write back block contents when writing bbt */ | 
|  | #define NAND_BBT_SAVECONTENT	0x00004000 | 
|  |  | 
|  | /* | 
|  | * Use a flash based bad block table. By default, OOB identifier is saved in | 
|  | * OOB area. This option is passed to the default bad block table function. | 
|  | */ | 
|  | #define NAND_BBT_USE_FLASH	0x00020000 | 
|  | /* | 
|  | * Do not store flash based bad block table marker in the OOB area; store it | 
|  | * in-band. | 
|  | */ | 
|  | #define NAND_BBT_NO_OOB		0x00040000 | 
|  | /* | 
|  | * Do not write new bad block markers to OOB; useful, e.g., when ECC covers | 
|  | * entire spare area. Must be used with NAND_BBT_USE_FLASH. | 
|  | */ | 
|  | #define NAND_BBT_NO_OOB_BBM	0x00080000 | 
|  |  | 
|  | /* | 
|  | * Flag set by nand_create_default_bbt_descr(), marking that the nand_bbt_descr | 
|  | * was allocated dynamicaly and must be freed in nand_cleanup(). Has no meaning | 
|  | * in nand_chip.bbt_options. | 
|  | */ | 
|  | #define NAND_BBT_DYNAMICSTRUCT	0x80000000 | 
|  |  | 
|  | /* The maximum number of blocks to scan for a bbt */ | 
|  | #define NAND_BBT_SCAN_MAXBLOCKS	4 | 
|  |  | 
|  | /* | 
|  | * Bad block scanning errors | 
|  | */ | 
|  | #define ONENAND_BBT_READ_ERROR		1 | 
|  | #define ONENAND_BBT_READ_ECC_ERROR	2 | 
|  | #define ONENAND_BBT_READ_FATAL_ERROR	4 | 
|  |  | 
|  | /** | 
|  | * struct bbm_info - [GENERIC] Bad Block Table data structure | 
|  | * @bbt_erase_shift:	[INTERN] number of address bits in a bbt entry | 
|  | * @options:		options for this descriptor | 
|  | * @bbt:		[INTERN] bad block table pointer | 
|  | * @isbad_bbt:		function to determine if a block is bad | 
|  | * @badblock_pattern:	[REPLACEABLE] bad block scan pattern used for | 
|  | *			initial bad block scan | 
|  | * @priv:		[OPTIONAL] pointer to private bbm date | 
|  | */ | 
|  | struct bbm_info { | 
|  | int bbt_erase_shift; | 
|  | int options; | 
|  |  | 
|  | uint8_t *bbt; | 
|  |  | 
|  | int (*isbad_bbt)(struct mtd_info *mtd, loff_t ofs, int allowbbt); | 
|  |  | 
|  | /* TODO Add more NAND specific fileds */ | 
|  | struct nand_bbt_descr *badblock_pattern; | 
|  |  | 
|  | void *priv; | 
|  | }; | 
|  |  | 
|  | /* OneNAND BBT interface */ | 
|  | extern int onenand_default_bbt(struct mtd_info *mtd); | 
|  |  | 
|  | #endif	/* __LINUX_MTD_BBM_H */ |